Join the first Otii teardown at the Design Automation Conference in San Francisco
June 14, 2018
We at Qoitech are excited to be taking part in the Design Automation Conference (DAC) on June 26th from 4:30 – 5:00pm in San Francisco, CA where Patrick Mannion will do a first teardown of the Otii Arc! He will get into what Otii Arc is made up of and what makes it tick. Attendees will have a chance to win a brand new Otii Arc!
The teardown is not the first time Patrick Mannion has taken interest in the Otii solution. Back in April, we were honored to receive a great review which resulted in this month’s teardown. “I’m actually so excited about the Otii Arc; Qoitech has entered the IoT device test arena with a novel, low-cost approach that stands up to incumbents tackling the same problems” – Patrick Mannion, ElectronicDesign.com.
DAC is recognized as the most prominent conference for design and automation of electronic systems. Participants come from a diverse worldwide community of more than 1,000 organizations that attend each year, represented by system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives, as well as researchers and academics from leading universities.
Taking part in the conference is an honor and a testament to the success of the hard work that the Qoitech team has put into the Otii solution. As power analysis of IoT devices is becoming increasingly important in the tech-industry, we are proud to put our product to the test.
In addition, attendees at the teardown event will get their names put in a hat to win a brand new Otii Arc to take home! Come join this teardown event to learn more about energy optimization within IoT and meet the Qoitech team members, who will be more than happy to answer questions on how to increase the battery life of your IoT products. Learn more about the event here.